Click the link above to get the full user guide for this product.
KUAIQU R-SPS15010S Semiconductor
Power Supply 150V 10A 1500W with OCP
& OVP for Semiconductor Device Testing
Key Features
0-150V Adjustable Output for Semiconductor Device Testing
Semiconductor devices may require different DC supply conditions during laboratory evaluation, engineering verification, and device-level testing. The R-SPS15010S provides a 0-150V adjustable DC output, allowing engineers to establish selected voltage conditions within the power supply's rated range.
The adjustable output makes the Semiconductor Power Supply suitable for compatible semiconductor devices, electronic components, and semiconductor-related test setups where a controllable DC source is required.
10A Current Capacity for Semiconductor Test Setups
The R-SPS15010S provides up to 10A output current and 1500W rated power, giving engineers substantial DC power capacity for compatible semiconductor device testing and related electronic test equipment.
The combination of adjustable voltage and current allows users to establish different electrical supply conditions according to the requirements and rated limits of the device under test.
4-Digit Display for Voltage, Current and Power Monitoring
During Semiconductor Device Testing, engineers need to observe the electrical conditions applied to the test setup. The R-SPS15010S provides a 4-digit Voltage, Current and Power Display for direct monitoring of the output.
The displayed readings allow users to observe changes in voltage, current, and power while the connected device or test circuit is operating, supporting comparison between different test conditions.
Precision Encoder for Controlled Test Parameter Adjustment
The Precision Encoder provides direct front-panel adjustment of voltage and current settings.
When a semiconductor device needs to be evaluated under different DC supply conditions, engineers can conveniently adjust the configured parameters and observe the resulting electrical response of the test setup.
OCP and OVP for Semiconductor Test Protection
The R-SPS15010S provides Over Current Protection and Over Voltage Protection as additional safeguards during semiconductor device testing.
These protection functions are useful when working with sensitive electronic devices and test circuits where abnormal current or voltage conditions may occur. OCP and OVP are protection functions and do not replace the protection requirements specified for the semiconductor device or external test circuit.
Output ON/OFF for Controlled Device Power Application
The Output ON/OFF function allows the operator to apply or remove DC output while retaining the configured voltage and current settings.
This can be useful for semiconductor testing procedures involving controlled power-up, shutdown, restart, and repeated application of DC power to compatible test devices or circuits.
M1-M4 Memory for Repeated Semiconductor Test Conditions
Semiconductor Device Testing may require several recurring voltage and current configurations. The M1-M4 4-Group Memory Function provides four groups for storing frequently used test settings.
When repeating established test conditions, engineers can recall stored parameters rather than manually configuring the same values each time, helping make repeated testing more convenient.
Panel Lock for Maintaining Test Parameters
Once the required test condition has been established, unintended changes to the front-panel controls can affect test consistency. The Panel Lock function helps prevent accidental parameter adjustment during operation.
This is useful when a semiconductor device or test circuit needs to remain under a defined DC power condition during a verification procedure.
USB, RS232 and RS485 Interfaces for Test Bench Connectivity
The R-SPS15010S provides USB, RS232 and RS485 interfaces, offering multiple connection options for compatible semiconductor laboratory and engineering test environments.
These interfaces can provide connectivity options when integrating the Semiconductor Power Supply into suitable test benches. They should not be interpreted as dedicated semiconductor analysis, device programming, or automated test functions.
Buzzer Mute for Laboratory Test Operation
The encoder knob includes a Buzzer function that can be muted. This provides additional operating convenience when engineers repeatedly adjust voltage and current settings during semiconductor device evaluation.
Applications
Semiconductor Device Testing
The R-SPS15010S provides adjustable DC power for compatible semiconductor devices requiring up to 150V, 10A, and 1500W. Engineers can establish selected supply conditions and monitor voltage, current, and power during device evaluation.
Semiconductor Device Power Evaluation
Different semiconductor devices may require different supply conditions during development and verification. The adjustable 0-150V output allows engineers to establish appropriate DC power conditions according to the requirements of the specific device and test procedure.
Semiconductor Component Testing
The R-SPS15010S can provide adjustable DC power for compatible semiconductor components and related electronic circuits during laboratory evaluation. Engineers can adjust the supply condition and observe the electrical response of the connected test setup.
Semiconductor Device Operating Condition Evaluation
Device behavior may vary when the applied DC supply condition changes. The Precision Encoder allows engineers to adjust voltage and current settings, while the 4-digit display provides direct visibility into the resulting voltage, current, and power.
This allows different test conditions to be compared within the rated capabilities of the Semiconductor Power Supply.
Semiconductor Device Startup and Shutdown Testing
The Output ON/OFF function supports controlled application and removal of DC power during semiconductor device testing.
This can be used for compatible power-up, shutdown, restart, and repeated power application procedures when evaluating the response of the device or test circuit.
High-Power Semiconductor Test Equipment
With a 1500W rated power and up to 10A output current, the R-SPS15010S provides substantial DC power capacity for compatible semiconductor test equipment and device-level test setups that require higher power than a conventional low-power bench supply.
Repeated Semiconductor Verification
For semiconductor testing procedures that use several established voltage and current conditions, the M1-M4 Memory Function provides four stored configurations.
This can reduce repeated manual adjustment when engineers evaluate multiple devices or repeat the same Semiconductor Device Testing procedure.
Semiconductor Laboratory Test Bench Integration
The R-SPS15010S combines adjustable DC output, 4-digit electrical monitoring, OCP, OVP, Output ON/OFF, Panel Lock, memory settings, and USB, RS232 and RS485 interfaces for suitable semiconductor laboratory and engineering test benches.
Quality Check and Terms of Service:
-
Package Includes: DC Power Supply ×1, Output Power Cord ×1, Input Power Cord ×1, User Manual ×1, Warranty Card ×1
-
CE & FCC Certification: The product has passed CE and FCC certification requirements.
-
Inspection Before Shipment: The DC power supply and included accessories are inspected before shipment to help ensure product quality.
-
Customer Support: Contact us with any questions, and our customer support team will respond within 24 hours.
Technical Specifications
| Parameter |
R-SPS15010S |
| Product Type |
High Power Adjustable DC Power Supply |
| Rated Voltage |
0-150V |
| Rated Current |
0-10A |
| Rated Power |
1500W |
| Operating Temperature |
0°C-40°C |
| Load Regulation, Voltage |
≤0.1% + 10mV |
| Load Regulation, Current |
≤0.1% + 2.5mA |
| Line Regulation, Voltage |
≤0.01% + 2.5mV |
| Line Regulation, Current |
≤0.1% + 2.5mA |
| Setting Resolution, Voltage |
10mV |
| Setting Resolution, Current |
10mA |
| Readback Resolution, Voltage |
10mV |
| Readback Resolution, Current |
10mA |
| Setting Accuracy, Voltage |
≤0.05% + 10mV |
| Setting Accuracy, Current |
≤0.01% + 10mA |
| Readback Accuracy, Voltage |
≤0.05% + 10mV |
| Readback Accuracy, Current |
≤0.01% + 10mA |
| Voltage Ripple |
≤3500mVp-p / ≤1200mVrms |
| Current Ripple |
≤200mArms |
| Rise Time, No Load |
≤100ms |
| Rise Time, Full Load |
≤150ms |
| Fall Time, No Load |
≤15s |
| Fall Time, Full Load |
≤50ms |
| Dynamic Response Time |
≤20ms |
| Efficiency |
≥85% |
| Display |
4-Digit Voltage, Current and Power Display |
| Memory Function |
M1-M4, 4 Groups |
| Protection |
OCP, OVP |
| Output Control |
Output ON/OFF |
| Interfaces |
USB, RS232, RS485 |
| Output Connection |
Front Output and Rear Output |
| Size |
Approx. 35 × 27 × 10cm |
Why Choose KUAIQU R-SPS15010S?
The KUAIQU R-SPS15010S Semiconductor Power Supply combines a 0-150V adjustable output, 0-10A maximum current, and 1500W rated power for Semiconductor Device Testing applications that require a flexible and higher-power DC source.
Its adjustable output allows engineers to establish different DC supply conditions for compatible semiconductor devices and test circuits. The Precision Encoder provides direct adjustment of voltage and current, while the 4-digit Voltage, Current and Power Display allows engineers to observe the electrical output during testing.
For sensitive semiconductor test setups, OCP and OVP provide additional protection functions. Output ON/OFF supports controlled power application and removal, while Panel Lock helps maintain established test parameters during operation.
For repeated Semiconductor Device Testing procedures, the M1-M4 4-Group Memory Function provides four stored configurations for commonly used voltage and current settings. The built-in USB, RS232 and RS485 interfaces also provide flexible connectivity options for suitable semiconductor laboratory and engineering test benches.
With its combination of Semiconductor Power Supply capability, 0-150V adjustable output, 10A current capacity, 1500W power rating, OCP and OVP, 4-group memory, electrical monitoring, Output ON/OFF, and practical test controls, the R-SPS15010S is a suitable DC power source for Semiconductor Device Testing, semiconductor device power evaluation, semiconductor component testing, operating condition evaluation, startup and shutdown testing, and repeated semiconductor verification within its rated specifications.
