KUAIQU SPPS-K605 60V 5A Programmable

DC Test Power Supply with Curve Display

for Semiconductor Testing

✦ Upgraded Dual-Curve Display (Voltage & Current)

The KUAIQU SPPS-K605 is a 60V 5A programmable DC test power supply designed for semiconductor testing, device characterization, circuit debugging, and laboratory validation. Equipped with a 2.8-inch TFT color LCD screen, it dynamically displays real-time voltage and current curves, allowing engineers to visually monitor output behavior during semiconductor device testing.

The dual-curve display helps engineers observe:

• Voltage and current variations

• Device startup and power-up response

• Load-related current changes

• Abnormal current fluctuations

• Power stability during semiconductor testing

• Output behavior under different test conditions

This visual monitoring makes it easier to identify abnormal power behavior and improve debugging efficiency when testing semiconductor devices, evaluation boards, control circuits, and related electronic systems.

✦ High-Precision Microampere Display

The SPPS-K605 features a 5-digit high-resolution digital display, providing 1mV voltage setting/readback resolution and high-resolution current measurement. In the low-current range below 20mA, current readback resolution reaches 10μA, helping engineers monitor small current changes during semiconductor device evaluation and low-power testing.

The SPPS-K605 supports:

• 0–60V adjustable output voltage

• 0–5A adjustable output current

• 300W maximum output power

• 1mV voltage setting/readback resolution

• 1mA current setting resolution

• 10μA current readback resolution below 20mA

• 5-digit high-resolution display

It is suitable for analyzing semiconductor device power consumption, low-current operating conditions, standby current, leakage-related current changes, and abnormal current behavior during testing.

✦ 4-Group Editable Memory Presets (M1-M4)

Designed for repeated semiconductor testing, the SPPS-K605 supports 4 memory presets (M1–M4) for quick parameter recall.

• Access Settings: Press the “Memory” button and rotate the “VOLTAGE” knob to select M1–M4.

• Edit Values: Long-press “VOLTAGE” to enter editing mode; short-press and rotate “VOLTAGE” or “CURRENT” to adjust values, then long-press “VOLTAGE” again to save.

• Recall Presets: Rotate and short-press “VOLTAGE” to load saved settings instantly.

This allows engineers to maintain consistent test conditions when switching between different semiconductor device operating states, reducing repetitive manual adjustments and improving testing efficiency.

✦ Advanced OVP / OCP / SCP Safety Protections

The SPPS-K605 provides comprehensive protection functions including OVP (Over-Voltage Protection), OCP (Over-Current Protection), and SCP (Short-Circuit Protection).

During semiconductor testing, incorrect wiring, excessive current demand, or unexpected device faults may cause abnormal operating conditions. The SPPS-K605 helps protect the power supply and connected test equipment by responding to over-voltage, over-current, and short-circuit conditions.

If a protection condition is detected, the display provides corresponding warning information such as “OVP,” “OCP,” or “Possible short circuit.”

These protection functions help provide safer power conditions for:

• Semiconductor devices

• IC evaluation boards

• Electronic component test fixtures

• PCB prototypes

• Power management circuits

OVP — Over Voltage Protection

Helps protect connected semiconductor devices and evaluation circuits from excessive output voltage.

OCP — Over Current Protection

Helps limit abnormal current conditions caused by overloads or unexpected device behavior.

SCP — Short Circuit Protection

Helps protect the power supply and connected semiconductor test circuits during accidental short circuits.

Panel Lock Function

Prevents unintended parameter changes during extended semiconductor testing and repeated test procedures.

✦ User-Friendly Operating Features

This programmable DC test power supply provides multiple convenient functions for semiconductor testing:

• Output Switch: Allows voltage and current parameters to be preset before power is applied to the device under test.

• Fast-Response Encoders: Support smooth and precise voltage/current adjustment.

• Safety Lock: Helps prevent accidental parameter changes during testing.

• Audible Feedback: Provides confirmation during operation and can be muted when required.

• Dual USB Ports: USB-A and Type-C provide convenient 5V/2A output for compatible external devices.

• Intelligent Cooling Fan: Helps maintain stable operation during extended testing.

These features simplify daily operation while improving safety and repeatability in semiconductor device development, evaluation, and validation.

✦ Compact Size & Powerful Performance

The SPPS-K605 combines a 0–60V / 0–5A adjustable output with a 300W maximum power rating, making it suitable for a wide range of semiconductor testing and electronic device evaluation applications.

Its compact design measures approximately 7.6 × 5.7 × 3.4 inches and weighs about 2.6 lbs, providing a practical bench-top solution for semiconductor laboratories, engineering workstations, R&D centers, and production testing environments.

With real-time voltage and current curve display, high-resolution measurement, adjustable output, memory presets, and multiple protection functions, the SPPS-K605 provides engineers with a flexible DC power platform for semiconductor testing.

It is particularly useful for evaluating:

• Semiconductor device startup behavior

• Device power consumption

• Standby and low-load current

• Current response under different operating conditions

• IC and evaluation-board power input characteristics

• Abnormal current conditions

• Power stability during device testing

✦ Wide Range of Applications

The SPPS-K605 is designed for engineering and laboratory applications requiring stable and adjustable DC power, especially:

Semiconductor Testing

• Semiconductor device testing

• IC power supply testing

• Semiconductor evaluation board testing

• Device startup and power-up testing

• Low-current device evaluation

• Semiconductor circuit debugging

• Device power consumption analysis

Electronic Component Testing

• Electronic component power testing

• Component operating-condition verification

• Current consumption measurement

• Low-power component testing

• Circuit protection testing

• Component performance evaluation

PCB & Circuit Testing

• PCB power testing

• IC circuit debugging

• Electronic circuit validation

• Prototype circuit testing

• Power input verification

• Evaluation board testing

Power Electronics Testing

• Power management circuit testing

• DC power conversion circuit evaluation

• Switching power circuit testing

• Current response analysis

• Load condition testing

The SPPS-K605 provides stable, adjustable DC power and real-time curve monitoring to improve testing efficiency across semiconductor, electronic component, PCB, and power circuit development applications.

✦ Quality Assurance & Customer Support

Each package includes:

1 × variable DC test power supply

1 × power cable

1 × output cable

1 × English user manual

All units and accessories undergo strict inspection before shipment to ensure reliable quality. We provide professional after-sales service and technical support. If you have any questions about the SPPS-K605 programmable DC test power supply, please feel free to contact us.

Technical Specifications

Why Choose KUAIQU SPPS-K605?

For semiconductor testing and electronic device validation, engineers need a stable, adjustable, and easy-to-monitor DC power source.

The KUAIQU SPPS-K605 combines:

✓ 0–60V / 0–5A adjustable output

✓ 300W power capability

✓ Real-time dual voltage & current curve display

✓ 1mV voltage setting/readback resolution

✓ 10μA low-current readback below 20mA

✓ 4 programmable memory presets

✓ OVP / OCP / SCP protection

✓ Precision encoder adjustment

✓ High-resolution 5-digit display

✓ USB-A + Type-C 5V/2A output

Providing an efficient testing solution for semiconductor device evaluation, IC testing, electronic component testing, PCB debugging, power consumption analysis, and electronic R&D applications.